The D8 is equipped with an X-ray source, detector and beam optics suitable for characterizing thin films and their heterostructure, powder materials. Detailed specifications and the characterization capabilities are below.
(a) The TRIO optics automated switching between different beam geometries
- Motorized slits for a focused beam geometry
- Göbel Mirror for high intensity Cu-Kα parallel beam
- Göbel Mirror + 2-Bounce Ge Channel cut monochromator.
(b) Caompact cradle sample stage
- Powders
- Thin films
- Angular rotation
- Sample tilt
- Sample height adjustment
(c) EIGER 2K 500K detector suitable for
- Powder diffraction
- Texture and residual stress analysis of thin films
- Thin film analysis with X-ray reflectometry
- Small angle X-ray scattering
- Reciprocal space mapping
